待续。

中国石化。

中石化。

中蓝设计院

3. 折光仪的维护
(1) 仪器应放在干燥、空气流通的室内，防止受潮后光学零件发霉。
(2) 仪器使用完毕须进行清洁并挥干后放入贮有干燥剂的箱内，防止湿气和灰尘侵入。
(3) 严禁油手或汗手触及光学零件，如光学零件不清洁，先用汽油后用二甲苯擦干净。切
勿用硬质物料触及棱镜，以防损伤。
(4) 仪器应避免强烈振动或撞击，以免光学零件损伤而影响精度。

The MPR E-Scan is a microprocessor-driven critical angle refractometer that is used to measure the refractive index of process fluids and may be used as an error indicator or an integral part of a complete process control system. The MPR E-Scan is equipped with a broad range of diagnostics to aid in fault isolation without the use of special test equipment. The refractometer is calibrated and temperature compensated to your process specifications. It is ready for installation and immediate use when received. Calibration procedures are available to change system parameters and allow the refractometer to measure different process fluids. EMC has combined accurate electronic scanning techniques with fast microprocessor circuit technology, blended with powerful and user friendly software. The MPR E-Scan is the refractometer for the 21st Century.
The MPR E-Scan utilizes state-of-the art CCD (charge coupled device) technology wherein the image is composed of simple light and dark periods that are electronically scanned. As the refractive index of the process changes, the change in critical angle changes the ratio of light to dark periods as seen by the CCD. This time period change is then further enhanced and displayed as a reading in refractive index, Brix, solids, or another measurement unit. This scanning time measurement technique, i.e. many times per second, provides high sensitivity combined with immunity to entrained air and pulpy streams. Further, the MPR E-Scan utilizes an LED light source which requires minimum power, generates less heat, and has maximum life expectancy.

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